Non-parametric Distance-based Classification Techniques and their Applications

AIMS AND SCOPE
This special issue focuses on a set of pattern recognition topics related with non-parametric distance-based classification. From a practical point of view, non-parametric distance-based classification is one of the most relevant classification approaches for real world problems. The main advantages of non-parametric distance-based classifiers are their simplicity in learning and on-line classification, excellent asymptotic performance when increasing the number of training samples, and the improvement in their classification rates through selection of support prototypes. On the other hand, great effort has been put into improving the distance-based classifiers through different pre-processing techniques such as editing, condensing, prototype selection, features selection, weighted prototype classification, and so on. From an application point of view, distance-based classification has been successfully used in almost any application field.

SUGGESTED TOPICS
We seek for original and high quality submissions related, but not limited, to one or more of the following topics:
• Distance based classification in metric and non metric spaces.
• Feature selection and extraction.
• Prototype selection.
• Editing and condensing.
• Non supervised distance-based classification.
• Applications.

SCHEDULE

Paper submission: Jan 7, 2007

Notification: May 30, 2007
Submission revised versions: July 30, 2007
Final notification: September 30, 2007
Camera Ready Papers: October 30, 2007
Tentative publication date: Autumn/Winter 2007

SUBMISSION PROCEDURE
All manuscripts must be submitted electronically through our PAA Online system (www.paaonline.net). The authors will submit the paper using the standard procedure and pressing a special issue button on screen called "NPC" (Non parametric classification) to indicate that the paper is for this special issue.

All manuscripts should conform to the standard format as indicated in the Guide for Authors of the Pattern Analysis and Applications. Prospective authors are invited to send an email to one of the guest editors indicating their interest in submitting a paper and the specific topics addressed.

SPECIAL ISSUE GUEST EDITORS

Prof. Filiberto Pla
Universitat Jaume I
Filiberto.Pla@lsi.uji.es

Dr. Jordi Vitrià
Universitat Autònoma de Barcelona
Jordi.Vitria@cvc.uab.es

Dr. Petia Radeva
Universitat Autònoma de Barcelona
Petia@cvc.uab.es